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1

Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis

Kang, K., Kufluoglu, H., Roy, K., Ashraful Alam, M.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Année:

2007

Langue:

english

Fichier:

PDF, 1.00 MB

english, 2007

2

off-State Degradation in Drain-Extended NMOS Transistors: Interface Damage and Correlation to Dielectric Breakdown

Varghese, D., Kufluoglu, H., Reddy, V., Shichijo, H., Mosher, D., Krishnan, S., Muhammad Ashraful Alam

Journal:

IEEE Transactions on Electron Devices

Année:

2007

Langue:

english

Fichier:

PDF, 910 KB

english, 2007

3

A Computational Model of NBTI and Hot Carrier Injection Time-Exponents for MOSFET Reliability

Haldun Kufluoglu, Muhammad Ashraful Alam

Journal:

Journal of Computational Electronics

Année:

2004

Langue:

english

Fichier:

PDF, 686 KB

english, 2004

4

A comprehensive model for PMOS NBTI degradation: Recent progress

M.A. Alam, H. Kufluoglu, D. Varghese, S. Mahapatra

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 533 KB

english, 2007

5

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Aging sensors for workload centric guardbanding in dynamic voltage scaling applications

Min Chen,, Kufluoglu, H., Carulli, J., Reddy, V.

Année:

2013

Langue:

english

Fichier:

PDF, 516 KB

english, 2013

6

[IEEE 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. - Austin, TX, USA (2005.05.11-2005.05.11)] 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. - On reliable circuits and systems: how reliability considerations are reshaping oxide scaling, device geometry, and VLSI algorithm

Alam, M., Kufluoglu, H., Paul, B., Kang, K., Roy, K.

Année:

2005

Langue:

english

Fichier:

PDF, 794 KB

english, 2005

7

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Thermally-aware sensor allocation for real-time monitoring and mitigation of FEOL aging in System-on-Chip (SoC) applications

Kufluoglu, Haldun, Chen, Min, Lu, Shan, Rabindranath, Ashwin, Kakoee, Reza, Hu, Shih-Hsin

Année:

2017

Langue:

english

Fichier:

PDF, 1.45 MB

english, 2017

8

Theory of interface-trap-induced NBTI degradation for reduced cross section MOSFETs

Kufluoglu, H., Alam, M.A.

Journal:

IEEE Transactions on Electron Devices

Année:

2006

Langue:

english

Fichier:

PDF, 357 KB

english, 2006

9

A Generalized Reaction–Diffusion Model With Explicit H– Dynamics for Negative-Bias Temperature-Instability (NBTI) Degradation

Kufluoglu, H., Alam, M.A.

Journal:

IEEE Transactions on Electron Devices

Année:

2007

Langue:

english

Fichier:

PDF, 236 KB

english, 2007

10

Recent Issues in Negative-Bias Temperature Instability: Initial Degradation, Field Dependence of Interface Trap Generation, Hole Trapping Effects, and Relaxation

Islam, A.E., Kufluoglu, H., Varghese, D., Mahapatra, S., Alam, M.A.

Journal:

IEEE Transactions on Electron Devices

Année:

2007

Langue:

english

Fichier:

PDF, 401 KB

english, 2007

11

Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits

Paul, B.C., Kunhyuk Kang, Kufluoglu, H., Alam, M.A., Roy, K.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Année:

2007

Langue:

english

Fichier:

PDF, 706 KB

english, 2007

12

Impact of NBTI on the temporal performance degradation of digital circuits

Paul, B.C., Kunhyuk Kang, Kufluoglu, H., Alam, M.A., Roy, K.

Journal:

IEEE Electron Device Letters

Année:

2005

Langue:

english

Fichier:

PDF, 200 KB

english, 2005

13

[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale Circuits

Paul, B.C., Kunhyuk Kang,, Kufluoglu, H., Alam, M.A., Roy, K.

Année:

2006

Langue:

english

Fichier:

PDF, 173 KB

english, 2006

14

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - A geometrical unification of the theories of NBTI and HCI time-exponents and its implications for ultra-scaled planar and surround-gate MOSFETs

Kufluoglu, H., Alam, M.A.

Année:

2004

Langue:

english

Fichier:

PDF, 258 KB

english, 2004

15

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - An analysis Of the benefits of NBTI recovery under circuit operating conditions

Kufluoglu, Haldun, Chancellor, C., Chen, M., Reddy, V.

Année:

2012

Langue:

english

Fichier:

PDF, 1.58 MB

english, 2012

16

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - History Dependent Recovery of NBTI under Alternating DC and AC Stress

Kufluoglu, Haldun, Prasad, Chetan, Agostinelli, Marty

Année:

2007

Langue:

english

Fichier:

PDF, 2.16 MB

english, 2007

17

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - An extensive and improved circuit simulation methodology for NBTI recovery

Kufluoglu, Haldun, Reddy, V., Marshall, A., Krick, J., Ragheb, T., Cirba, C., Krishnan, A., Chancellor, C.

Année:

2010

Langue:

english

Fichier:

PDF, 824 KB

english, 2010

18

Critical analysis of short-term negative bias temperature instability measurements: Explaining the effect of time-zero delay for on-the-fly measurements

Islam, Ahmad Ehteshamul, Kufluoglu, Haldun, Varghese, Dhanoop, Alam, Muhammad Ashraful

Journal:

Applied Physics Letters

Année:

2007

Langue:

english

Fichier:

PDF, 452 KB

english, 2007

19

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Universality of Off-State Degradation in Drain Extended NMOS Transistors

Varghese, D., Kufluoglu, H., Reddy, V., Shichijo, H., Krishnan, S., Alam, M. A.

Année:

2006

Langue:

english

Fichier:

PDF, 467 KB

english, 2006

20

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - A physical and scalable aging model for digital library characterization

Kufluoglu, Haldun, Cirba, C., Chu, M., Chen, M., Datla, S., Reddy, V.

Année:

2014

Langue:

english

Fichier:

PDF, 371 KB

english, 2014

21

[IEEE 2006 International Conference on Computer Design - San Jose, CA, USA (2007.10.1-2007.10.4)] 2006 International Conference on Computer Design - Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI

Kang, Kunhyuk, Kufluoglu, Haldun, Alam, Muhammad Ashraful, Roy, Kaushik

Année:

2006

Langue:

english

Fichier:

PDF, 435 KB

english, 2006

22

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Multi-probe Two-Dimensional Mapping of Off-State Degradation in DeNMOS Transistors: How and Why Interface Damage Predicts Gate Dielectric Breakdown

Varghese, D., Kufluoglu, H., Reddy, V., Shichijo, H., Mosher, D., Krishnan, S., Alam, M. A.

Année:

2007

Langue:

english

Fichier:

PDF, 3.70 MB

english, 2007

23

Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators

Küflüoğlu, Haldun, Chancellor, Cathy, Chen, Min, Cirba, Claude, Reddy, Vijay

Journal:

ACM Journal on Emerging Technologies in Computing Systems

Année:

2014

Langue:

english

Fichier:

PDF, 8.05 MB

english, 2014

24

A Chemical Sensor Using Neurons and a 3-D Micro-fluidic Chip

McNally, H., Kufluoglu, H., Akin, D., Grimmer, J., Walker, J., Shi, R., Borgens, R., Bashir, R.

Journal:

MRS Proceedings

Année:

2002

Langue:

english

Fichier:

PDF, 272 KB

english, 2002